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Lead-free dielectric thin-film capacitors with desirable energy storagedensity are gathering attention due to the increasing environmental concern andthe integrating electronic devices. We here reported a series of newhighly-orientated (1-x)NaNbO3-xBaHfO3 (x<0.15) lead-free thin films prepared bya sol-gel method, and presented the dependence of their structural, electricaland energy storage properties on the x level of BaHfO3. The microstructure,leakage current and breakdown strength of pristine NaNbO3 thin films aresignificantly improved by addition of BaHfO3. As a result, the superior energystorage performances were obtained at x=0.1 with recoverable energy storagedensity of 23.1 J/cm3 at 1100 kV/cm, excellent thermal stability from 30 to 2100C, good fatigue resistance, and the fast charge-discharge rate.

Structural, electrical and energy storage properties of lead-free NaNbO3-BaHfO3 thin films