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We characterized SnO2:F/p-type a-Si:H heterojunctions by current-voltage (I-V) and capacitance-voltage (C-V) measurements at\udroom temperature to determine the junction parameters. Samples with circular geometry and different diameters were\udcharacterized. The current scales with the junction area, and the current density J as a function of the voltage V is a slightly\udasymmetric curve with a super-linear behaviour (cubic law) for high voltages. Using a transmission line model valid for devices\udwith circular geometry, we studied the effects of the SnO2:F resistivity on the measured capacitance when the SnO2:F layer\udworks as an electrical contact. The measured C-V curve allows us to determine junction parameters as doping of p-type a-Si:H,\udbuilt-in potential and depletion width for the heterojunction with the smallest diameters, demonstrating that for these samples the\udTCO effects can be neglected. We compared theoretical and measured data to explain qualitatively the transport mechanism in\udthis heterojunction

Capacitance study of thin film SnO2 :F/p-type a-Si:H heterojunctions