English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

Sputtering of organic materials using a C 60 primary ion beam has been demonstrated to produce significantly less accumulated damage compared to sputtering with monatomic and atomic-cluster ion beams. However, much about the dynamics of C 60 sputtering remains to be understood. We introduce data regarding the dynamics of C 60 sputtering by evaluating TOF-SIMS depth profiles of bulk poly(methyl methacrylate) (PMMA). Bulk PMMA provides an ideal test matrix with which to probe C 60 sputter dynamics because there is a region of steady-state secondary ion yield followed by irreversible signal degradation. C 60 sputtering of PMMA is evaluated as a function of incident ion kinetic energy using 10 keV C 60 + , 20 keV C 60 + and 40 keV C 60 ++ primary ions. Changes in PMMA chemistry, carbon accumulation and graphitization, and topography as a function of total C 60 ion dose at each accelerating potential is addressed.

C60 sputtering of organics: A study using TOF-SIMS, XPS and nanoindentation