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We examine the effect of different sources of technical noise on inverse weakvalue-based precision phase measurements. We find that this type of measurementis similarly robust to technical noise as related experiments in the weak valueregime. In particular, the measurements considered here are robust to additiveGaussian white noise and angular jitter noise commonly encountered in opticalexperiments. Additionally, we show the same techniques used for precision phasemeasurement can be used with the same technical advantages for opticalfrequency measurements.

Noise suppression in inverse weak value based phase detection