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The composition and crystal structure of the constituents of the periodic layered microstructure developed during the solid-state reaction between Co 2 Si intermetallic and zinc at 390 °C were investigated using scanning electron microscopy, transmission electron microscopy, and electron-probe microanalysis. It was demonstrated that the periodic layered morphology generated in the reaction zone of the Co 2 Si/Zn diffusion couples consists of bands of  in situ- formed precipitates of cubic CoSi intermetallic, embedded in a continuous matrix of Co-Zn - based hexagonal phase containing a small amount of silicon. It was suggested that the formation of the hexagonal intermetallic of the same crystal structure as the binary  δ  phase of the Co-Zn system can be attributed to the possible stabilizing effect of silicon: the  δ -phase structure becomes stable in the ternary Co-Si-Zn system at 390 °C.

On Constituents of the Periodic Layered Microstructure Developed in the Solid-State Reaction Between Zinc and Co2Si