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The orientation of the tilted magnetic anisotropy has crucial importance inmany spintronic devices. However, it is very challenging to determine itespecially in very small structures produced by lithography. Here, we propose anew experimental method to directly and accurately measure both the polar andazimuthal angles of a tilted magnetic anisotropy. By using the proposedexperimental method, we have successfully determined the out-of-plane andin-plane angles of the tilted magnetic anisotropy in a micro-structuredmultilayer thin film. The orientation of the tilted magnetic anisotropy in thesample has also been confirmed by the theoretical simulations proving theaccuracy of the method.

Experimental determination of the orientation of tilted magnetic anisotropy by measuring Hall voltage