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Transition-edge sensors (TESs) are used as very sensitive thermometers inmicrocalorimeters aimed at detection of different wavelengths. In particular,for soft X-ray astrophysics, science goals require very high resolutionmicrocalorimeters which can be achieved with TESs coupled to suitableabsorbers. For many applications there is also need for a high number of pixelswhich typically requires multiplexing in the readout stage. Frequency DomainMultiplexing (FDM) is a common scheme and is the baseline proposed for theATHENA mission. FDM requires biasing the TES in AC at MHz frequencies. Recentlythere has been reported degradation in performances under AC with respect to DCbias. In order to assess the performances of TESs to be used with FDM, it isthus of great interest to compare the performances of the same device bothunder AC and DC bias. This requires two different measurement setups withdifferent processes for making the characterization. We report in this work thepreliminary results of a single pixel characterization performed on a TiAu TESunder AC and afterwards under DC bias in different facilities. Extraction ofdynamical parameters and noise performances are compared in both cases as afirst stage for further AC/DC comparison of these devices.

AC/DC characterization of a Ti/Au TES with Au/Bi absorber for X-ray detection