English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

Soft protons are a potential threat for X-ray missions using grazingincidence optics, as once focused onto the detectors they can contribute toincrease the background and possibly induce radiation damage as well. Theassessment of these undesired effects is especially relevant for the future ESAX-ray mission Athena, due to its large collecting area. To prevent degradationof the instrumental performance, which ultimately could compromise some of thescientific goals of the mission, the adoption of ad-hoc magnetic diverters isenvisaged. Dedicated laboratory measurements are fundamental to understand themechanisms of proton forward scattering, validate the application of theexisting physical models to the Athena case and support the design of thediverters. In this paper we report on scattering efficiency measurements ofsoft protons impinging at grazing incidence onto a Silicon Pore Optics sample,conducted in the framework of the EXACRAD project. Measurements were taken attwo different energies, ~470 keV and ~170 keV, and at four different scatteringangles between 0.6 deg and 1.2 deg. The results are generally consistent withprevious measurements conducted on eROSITA mirror samples, and as expected thepeak of the scattering efficiency is found around the angle of specularreflection.

Scattering efficiencies measurements of soft protons at grazing incidence from an Athena Silicon Pore Optics sample