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Measurement of the penetration depth λ() as a function of temperature using millimeter wave transmission in the range 130-500GHz are reported for three YBa (YBCO) laser ablated thin films. Two films, deposited on a LaAlO substrate ( =90.2 K), exhibit a narrow resistive transition (0.3 K). One has been subsequently irradiated with He ions in order to increase the scattering rate of the quasi-particles ( =87.8 K). The third film, grown on MgO ( =88.5 K), exhibits also a fairly narrow transition (0.8 K) and a high crystalline quality. The experiment provides the absolute value λ(≤ 30K) for the penetration depth at low temperature: the derivation from the transmission data and the experimental uncertainty are discussed. We find a zero temperature penetration depth λ = 1990 ± 200 Å, 2180 ± 200 Å and 2180 ± 200Å, for YBCO-500 Å/LaAlO (pristine), YBCO-1300 Å/MgO and YBCO-500 Å/LaAlO (irradiated) respectively. λ(≤ 30 K) exhibits a different behavior for the three films. In the pristine sample, λ( ≤ 30 K) shows a clear , namely the temperature dependence is consistent with a linear variation, whose slope decreases with frequency: this is considered as an evidence for the scattering rate being of the order of the measuring frequency. A two fluids analysis yields 1/τ ( ≤ 30 K) ~ 1.7 × 10 s. In the two other samples, λ ( ≤ 30 K) does not display any frequency dependence, suggesting a significantly larger scattering rate. The temperature dependence is different in these latter samples. It is consistent with a linear variation for the YBCO/MgO sample, not for the YBCO/LaAlO irradiated one, which exhibits a T dependence up to 40 K. We have compared our data to the predictions of the -wave model incorporating resonant scattering and we do not find a satisfactory agreement. However, the large value of λ in the pristine sample is a puzzle and sheds some doubt on a straightforward comparison with the theory of data from thin films, if considered as dirty -wave superconductors.

Low temperature penetration depth and the effect of quasi-particle scattering measured by millimeter wave transmission in YBa Cu O thin films