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Non-destructive depth-dependent morphological characterization of ferroelectric:semiconducting polymer blend films
Author(s) -
Nicoletta Spampinato,
Gilles Pécastaings,
Mario Maglione,
Georges Hadziioannou,
Eleni Pavlopoulou
Publication year - 2021
Publication title -
colloid and polymer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.382
H-Index - 87
eISSN - 1435-1536
pISSN - 0303-402X
DOI - 10.1007/s00396-020-04803-4
Subject(s) - materials science , piezoresponse force microscopy , ferroelectricity , polymer , polymer blend , characterization (materials science) , microscopy , kelvin probe force microscope , substrate (aquarium) , morphology (biology) , thin film , layer (electronics) , composite material , scanning probe microscopy , nanotechnology , atomic force microscopy , optoelectronics , optics , copolymer , dielectric , geology , physics , genetics , oceanography , biology

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