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By knowing the phase and modules of the reflection coefficient in neutronreflectometry problems, a unique result for the scattering length density (SLD)of a thin film can be determined which will lead to the exact determination oftype and thickness of the film. In the past decade, several methods have beenworked out to resolve the phase problem such as dwell time method, referencelayer method and variation of surroundings, among which the reference methodand variation of surroundings by using a magnetic substrate and polarizedneutrons is of the most applicability. All of these methods are based on thesolution of Schrodinger equation for a discontinuous and step-like potential ateach interface. As in real sample there are some smearing and roughness atboundaries, consideration of smoothness and roughness of interfaces wouldaffect the final output result. In this paper, we have investigated the effectsof smoothness of interfaces on determination of the phase of reflection as wellas the retrieval process of the SLD, by using a smooth varying function (Eckartpotential). The effects of roughness of interfaces on the same parameters, havealso been investigated by random variation of the interface around it meanposition.

Detection of nano scale thin films with polarized neutron reflectometry at the presence of smooth and rough interfaces