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An extended X-ray absorption fine structure (EXAFS) beam-line for X-ray absorption studies using energy dispersive geometry and position sensitive detector is being developed for the INDUS-II synchrotron source. The optical design of the beam-line has been completed based on the working principle that a single crystal bent in the shape of an ellipse by a crystal bender would act as a dispersing as well as focusing element. The heart of the beam-line is the crystal bender which has been designed on the basis of the principle of four-point bending and has been fabricated indigenously. The crystal bender is capable of producing pre-defined elliptical curvature on a crystal surface by applying different couples at the two-ends of the crystal which has variable width along its length. The focusing property of the crystal bender has been tested using a laser source and has been compared with the theoretically simulated results.

Design, fabrication and testing of elliptical crystal bender for the EXAFS beam-line at INDUS-II synchrotron source