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This paper presents a method for minimizing test suites for embedded, nondeter- ministic Finite State Machines. The method preserves the fault coverage of the original test suite, and can be used in conjunction with any technique for generating test suites. The minimization is achieved by detecting and deleting redundant test cases in the test suite. The proposed method is an extension of the work presented in (YCL98). experts; the derived test suite is afterwards reduced without loss of its completeness. In this paper we propose a method for minimizing a test suite for communicating nonde- terministic Finite State Machines (FSMs) while maintaining its fault-coverage. We consider a specification system composed of two communicating FSMs. One of these machines, called component, is the machine that needs testing. The other machine, called context, describes the behavior of the part of the system which is assumed to be correctly implemented. Component, context or the overall system may be nondeterministic.

Test Suite Minimization for Embedded Nondeterministic Finite State Machines