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We discuss how specification coverage and fault coverage based test derivation strategies can be combined. In particular, the problem of deriving a test suffix, which raises tester confidence in the configuration of the system, reached after a test derived by a specification coverage criterion, is formalized and solved in the CEFSM setting. The traditional mutant-based test derivation approach is extended with nondeterministic mutants to cover more faults. An experimental tool and case study are reported.

Test Generation for CEFSM Combining Specification and Fault Coverage