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This document describes an industrial application of the B method in smart card applications. In smart card memory, data modification may be interrupted due to a card withdrawal or a power loss. The EEPROM memory may result in an unstable state and the values subsequently read may be erroneous. The transaction mechanism provides a secure means for modifying data located in the EEPROM. As the security in smart card applications is paramount, the use of the B formal method brings high confidence and provides mathematical proof that the design of the transaction mechanism fulfills the security requirements.

The Use of the B Formal Method for the Design and the Validation of the Transaction Mechanism for Smart Card Applications