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The reliability of fast repeated erasures is studied experimentally and theoretically in a 1‐bit underdamped memory. The bit is encoded by the position of a micro‐mechanical oscillator whose motion is confined in a double well potential. To contain the energetic cost of fast erasures, a resonator with high quality factor  Q  is used: the erasure work    W  $\mathcal {W}$    is close to Landauer's bound, even at high speed. The drawback is the rise of the system's temperature  T  due to a weak coupling to the environment. Repeated erasures without letting the memory thermalize between operations result in continuous warming, potentially leading to a thermal noise overcoming the barrier between the potential wells. In such a case, the reset operation can fail to reach the targeted logical state. The reliability is characterized by the success rateR  i  s   $R^{\textrm {s}}_i$    after  i  successive operations.    W  $\mathcal {W}$   ,  T , andR  i  s   $R^{\textrm {s}}_i$    are studied experimentally as a function of the erasure speed. Above a velocity threshold,  T  soars whileR  i  s   $R^{\textrm {s}}_i$    collapses: the reliability of too‐fast erasures is low. These experimental results are fully justified by two complementary models. It is demonstrated that  Q  ≃ 10 is optimal to contain energetic costs and maintain high‐reliability standards for repeated erasures at any speed.

Reliability and Operation Cost of Underdamped Memories during Cyclic Erasures