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This paper presents three parallel procedures implemented in a shared-memory multiprocessor to generate the patterns that allow the testing of digital circuits. The implementation of these procedures in a multiprocessor uses the system memory better than in a distributed-memory multicomputer, since it is not necessary to store the circuit structure in the local memory of each processor, besides other common structures. The parallel test generation procedures are based on a new sequential algorithm which mixes both the Boolean difference and digital spectral techniques. It is thus different from other methods proposed that deal with the parallelization of test generation algorithms that carry out an implicit enumeration of the input pattern space. The first procedure distributes the set of faults using a backtracking procedure starting from a primary output and allocating a similar number of lines to each processor. The second procedure distributes the set of faults among the processors taking into account the distance from each line to its nearest primary output; it then applies the algorithm to generate the test pattern with some modifications. The third procedure uses a circuit partitioning procedure which allows similar sized parts of the circuit to be assigned to each processor while communications between processors are minimized. The experimental results obtained when the procedures are applied to the usual benchmark circuits (the ISCAS set) show figures for speedup better than in a multicomputer, although fewer processors are used. Copyright  2000 John Wiley & Sons, Ltd.

Parallel VLSI test in a shared-memory multiprocessor