English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

Based on possible defects on the layout of a practical non-ideal switch, fault model and test generation of current copiers, basic building block of switched-current circuits, are presented in this study, where we consider two types of switches, current switches and voltage switches, which have been commonly used in both switched-current circuits and switched-capacitor circuits. Both catastrophic and parametric faults of transistors used as switches are considered. Test sequences are proposed to achieve full testability of both current copiers and switched-current circuits. ( 1998 John Wiley & Sons, Ltd.

Fault macromodel for switches in switched-current circuits