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Fault macromodel for switches in switched‐current circuits
Author(s) -
Wang ChengPing,
Wey ChinLong
Publication year - 1998
Publication title -
international journal of circuit theory and applications
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.364
H-Index - 52
eISSN - 1097-007X
pISSN - 0098-9886
DOI - 10.1002/(sici)1097-007x(199801/02)26:1<93::aid-cta1>3.0.co;2-n
Subject(s) - switched capacitor , electronic circuit , testability , fault (geology) , computer science , electronic engineering , current (fluid) , parametric statistics , electrical engineering , capacitor , voltage , engineering , reliability engineering , mathematics , statistics , seismology , geology
Based on possible defects on the layout of a practical non‐ideal switch, fault model and test generation of current copiers, basic building block of switched‐current circuits, are presented in this study, where we consider two types of switches, current switches and voltage switches, which have been commonly used in both switched‐current circuits and switched‐capacitor circuits. Both catastrophic and parametric faults of transistors used as switches are considered. Test sequences are proposed to achieve full testability of both current copiers and switched‐current circuits. © 1998 John Wiley & Sons, Ltd.