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Magnetite thin fims have been grown epitaxially on ZnO and MgO substratesusing molecular beam epitaxy. The film quality was found to be stronglydependent on the oxygen partial pressure during growth. Structural, electronic,and magnetic properties were analyzed utilizing Low Energy Electron Diffraction(LEED), HArd X-ray PhotoElectron Spectroscopy (HAXPES), Magneto Optical KerrEffect (MOKE), and X-ray Magnetic Circular Dichroism (XMCD). Diffractionpatterns show clear indication for growth in the (111) direction on ZnO.Vertical structure analysis by HAXPES depth profiling revealed uniformmagnetite thin films on both type of substrates. Both, MOKE and XMCDmeasurements show in-plane easy magnetization with a reduced magnetic moment incase of the films on ZnO.

Epitaxial growth of Fe3O4 thin films on ZnO and MgO substrates