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Fresnel theory is used to derive the complex electric-fields above and belowan X-ray reflecting interface that separates two materials with differingindices of refraction. The interference between the incident and reflectedwaves produces an X-ray standing wave (XSW) above the reflecting interface. TheXSW intensity modulation is strongly enhanced by the total external reflection(TR) condition, which occurs at incident angles less than the critical angle.At these small milliradian incident angles the XSW period (lambda/2theta)becomes very large, which makes the TR-XSW an ideal probe for studyinglow-density structures that extend 1 to 1000 nm above the reflecting interface.Fourier inversion of the XSW induced modulation in the X-ray fluorescence (XRF)yield from a specific atomic distribution within the overlayer directlyproduces a model-independent 1-D atomic density profile. The modulation canalso be used to analyze the degree of coherence in the incident X-ray beam.

X-Ray Standing Waves at the Total Reflection Condition: Direct Method and Coherence Effects