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We present a systematic study of the Raman spectra of optical phonons ingraphene monolayers under tunable uniaxial tensile stress. Both the G and 2Dbands exhibit significant red shifts. The G band splits into two distinctsub-bands (G+, G-) because of the strain-induced symmetry breaking. Ramanscattering from the G+ and G- bands shows a distinctive polarization dependencethat reflects the angle between the axis of the stress and the underlyinggraphene crystal axes. Polarized Raman spectroscopy therefore constitutes apurely optical method for the determination of the crystallographic orientationof graphene.

Raman Spectroscopy of Graphene under Uniaxial Stress: Phonon Softening and Determination of the Crystallographic Orientation