English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Zendy Plus

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Zendy Tools

Zendy Open

We apply spinning-disc picometrology to measure the complex refractive indexof graphene on thermal oxide on silicon. The refractive index varies from n =2.4-1.0i at 532 nm to n = 3.0-1.4i at 633 nm at room temperature. Thedispersion is five times stronger than bulk graphite (2.67-1.34i to 2.73-1.42ifrom 532 nm to 633 nm).

Strong Anomalous Optical Dispersion of Graphene: Complex Refractive Index Measured by Picometrology