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The article describes an attempt to solve at once three basic problemsarising at testing a complex digital equipment for defects: 1) the problem ofan exponential increasing of the complexity of testing the equipment with thecomplexity of the equipment; 2) the problem of testing of the tester; 3) theproblem of a mutual masking of defects. The proposed solution is nothing morethan using certain limitations for connections between usual logical gates.Arbitrary multiple stuck-at-faults are supposed as defects.

Easily testable logical networks based on a 'widened long flip-flop'