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An analogue testing standard IEEE 1149.4 is mainly targeted for low-frequencytesting. The problem studied in this paper is extending the standard also forradio frequency testing. IEEE 1149.4 compatible measurement structures (ABMs)developed in this study extract the information one is measuring from the radiofrequency signal and represent the result as a DC voltage level. The ABMspresented in this paper are targeted for power and frequency measurementsoperating in frequencies from 1 GHz to 2 GHz. The power measurement errorcaused by temperature, supply voltage and process variations is roughly 2 dBand the frequency measurement error is 0.1 GHz, respectively.

IEEE 1149.4 Compatible ABMs for Basic RF Measurements