Open AccessTHE MEASUREMENTS OF HARD X-RAY FLUCTUATIONS IN THE HT-6B TOKAMAK
Author(s) -
Zhengmin Wang,
Linzhong Li
Publication year - 1987
Publication title -
acta physica sinica
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.36.960
Subject(s) - sawtooth wave , tokamak , physics , detector , scintillation , range (aeronautics) , optics , semiconductor detector , atomic physics , nuclear physics , materials science , plasma , computer science , computer vision , composite material
Nal(Tl) scintillation detector and Si(Au) surface barrier semiconductor detector are used to measure X-ray fluctuations in the HT-6B Tokamak device. The hard X-ray emission and sawtooth oscillations have been observed. The experiment shows hard X-ray fluctuations are due to MHD disturbances in the frequency range of 2-25 kHz.
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