Open AccessConformance Testing for IEC 61850 Communication Protocol of Intelligent Electronic Devices
Author(s) -
M. Pradish,
Amit Jain
Publication year - 2020
Publication title -
the journal of cpri
Language(s) - English
Resource type - Journals
ISSN - 0973-0338
DOI - 10.33686/pwj.v16i1.153171
Subject(s) - iec 61850 , interoperability , international standard , automation , conformance testing , protocol (science) , embedded system , computer science , communications protocol , engineering , reliability engineering , telecommunications , operating system , mechanical engineering , medicine , alternative medicine , pathology , standardization