Open AccessEstimation of Reliability through the Wiener Degradation Process Based on the Genetic Algorithm to Estimating Parameters
Author(s) -
Mostafa Abdul-Jabbar Dawod,
Entsar Arebe Fadam
Publication year - 2022
Publication title -
mağallaẗ al-ʿulūm al-iqtiṣādiyyaẗ wa-al-idāriyyaẗ
Language(s) - English
Resource type - Journals
eISSN - 2518-5764
pISSN - 2227-703X
DOI - 10.33095/jeas.v28i133.2349
Subject(s) - wiener process , reliability (semiconductor) , degradation (telecommunications) , algorithm , process (computing) , monte carlo method , inverse gaussian distribution , gaussian , genetic algorithm , computer science , maximum likelihood , statistics , mathematics , mathematical optimization , distribution (mathematics) , telecommunications , mathematical analysis , power (physics) , physics , quantum mechanics , operating system