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THE PROBLEM OF ASSESSING THE RELIABILITY OF MICROPROCESSOR RELAY PROTECTION DEVICES
Author(s) -
С. В. Бочкарев,
Р. Р. Хисамов
Publication year - 2018
Publication title -
naučno-tehničeskij vestnik povolžʹâ
Language(s) - English
Resource type - Journals
ISSN - 2079-5920
DOI - 10.24153/2079-5920-2018-8-6-91-94
Subject(s) - relay , reliability (semiconductor) , microprocessor , reliability engineering , digital protective relay , computer science , protective relay , embedded system , engineering , physics , quantum mechanics , power (physics)

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