Open AccessMetrological traceability chains for high DC voltage and voltages ratio
Author(s) -
Oleh Velychko,
Ruslan Vendychanskyi
Publication year - 2022
Publication title -
ukraïnsʹkij metrologìčnij žurnal
Language(s) - English
Resource type - Journals
eISSN - 2522-1345
pISSN - 2306-7039
DOI - 10.24027/2306-7039.1.2022.258823
Subject(s) - traceability , metrology , calibration , measurement uncertainty , voltage , high voltage , computer science , engineering , process engineering , electrical engineering , systems engineering , physics , optics , software engineering , quantum mechanics