Open AccessEffective PCB Defect Detection Using Stacked Autoencoder with Bi-LSTM Network
Author(s) -
Jithendra P R Nayak,
B. D. Parameshachari
Publication year - 2022
Publication title -
international journal of intelligent engineering and systems
Language(s) - English
Resource type - Journals
eISSN - 2185-310X
pISSN - 1882-708X
DOI - 10.22266/ijies2022.1031.05
Subject(s) - autoencoder , computer science , artificial intelligence , embedded system , deep learning