Open AccessCorrelated electron processes in ion-atom collisions
Author(s) -
Douglas W. McColm
Publication year - 1990
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.2172/7188360
Subject(s) - ion , projectile , atomic physics , electron , yield (engineering) , physics , spectral line , electron capture , electron ionization , highly charged ion , atom (system on chip) , nuclear physics , ion source , ionization , computer science , thermodynamics , quantum mechanics , astronomy , embedded system
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