Open AccessMeasuring depth profiles of residual stress with Raman spectroscopy
Author(s) -
W S Enloe,
R G Sparks,
M. A. Paesler
Publication year - 1988
Language(s) - English
Resource type - Reports
DOI - 10.2172/476628
Subject(s) - residual stress , stress (linguistics) , materials science , residual , raman spectroscopy , variation (astronomy) , optics , composite material , computer science , physics , algorithm , philosophy , linguistics , astrophysics
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