L‐4:  Late‐News Paper : ThinCRT Display Technology Operating Life and Reliability Issues | Zendy

Hopple George | Zendy; Curtin Chris | Zendy; Hatano Y. | Zendy

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L‐4: Late‐News Paper : ThinCRT Display Technology Operating Life and Reliability Issues

Author(s) -

Hopple George,

Curtin Chris,

Hatano Y.

Publication year - 2000

Publication title -

sid symposium digest of technical papers

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.351

H-Index - 44

eISSN - 2168-0159

pISSN - 0097-966X

DOI - 10.1889/1.1832895

Subject(s) - reliability (semiconductor) , reliability engineering , key (lock) , process (computing) , field (mathematics) , tube (container) , cathode ray tube , selection (genetic algorithm) , cathode , computer science , engineering , electrical engineering , mechanical engineering , computer security , operating system , physics , power (physics) , mathematics , quantum mechanics , pure mathematics , artificial intelligence

Operating Life and Reliability are key market eligibility factors for all field emission displays. Proper faceplate, cathode and vacuum tube design as well as material and process selection are essential elements of a stable, reliable display. Discussion of the impact of these elements on life and reliability of Candescent's ThinCRT technology demonstrates their importance.

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