Open Access
Damage-free Structural and Optical Characterization for InGaN/GaN Multi-Quantum Well Epi-Layers
Author(s) -
Young Joon Yoon,
Mi-Yang Kim,
Joon Seop Kwak
Publication year - 2013
Publication title -
asian journal of chemistry/asian journal of chemistry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.145
H-Index - 34
eISSN - 0975-427X
pISSN - 0970-7077
DOI - 10.14233/ajchem.2013.oh35
Subject(s) - chemistry , characterization (materials science) , optoelectronics , quantum , nanotechnology , quantum mechanics , physics , materials science