Spatial resolution of edge illumination X-ray phase-contrast imaging

We analyze the spatial resolution of edge illumination X-ray phase-contrast imaging and its dependence upon various experimental parameters such as source size, source-to-sample and sample-to-detector distances, X-ray energy and size of the beam-shaping aperture. Different propagation regimes, as well as the beam divergence and polychromaticity encountered with laboratory sources, are also considered. We show that spatial resolution in edge illumination phase-contrast imaging presents peculiar features compared to other X-ray phase-contrast techniques. In particular, in the direction orthogonal to the s or mask lines used to shape the beam, this can be better than both the pixel dimension and the projected source size. Numerical simulations based on Fresnel diffraction integrals are presented, which confirm the analytical predictions. The obtained results allow a simple estimation of the spatial resolution for edge-illumination phase imaging in both synchrotron and laboratory setups.