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Method for Inferring AS Relationship Based on Temporal and Spatial Reliability
Author(s) -
Lei Liu
Publication year - 2016
Publication title -
software engineering and applications
Language(s) - English
Resource type - Journals
eISSN - 2325-2286
pISSN - 2325-2278
DOI - 10.12677/sea.2016.51005
Subject(s) - reliability (semiconductor) , computer science , reliability engineering , data mining , engineering , physics , power (physics) , quantum mechanics

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