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Application of edge detection method based on image quality gradient for twin detection
Author(s) -
CHEN D.,
LUI G.T.,
KUO J.C.
Publication year - 2009
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2009.03192.x
Subject(s) - crystal twinning , orientation (vector space) , image (mathematics) , edge detection , materials science , enhanced data rates for gsm evolution , artificial intelligence , diffraction , image processing , computer science , pattern recognition (psychology) , mathematics , optics , physics , geometry , microstructure , metallurgy
Summary An image quality based method was applied to quantitatively analyse the contribution of electrodeposited copper twinning. This method, based on the image quality as obtained from electron backscattering diffraction, involves three processes: hexagonal edge detection, thinning algorithm and twin determination. The twin density determined by the new algorithm was 65.61% which is higher than the twin density, 57.44% as determined by the Orientation Imaging Microscopy (OIM) analysis. The newly developed algorithm provides an alternative to twin boundary detection.

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