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Estimation of Fracture Toughness by Intrinsic Flaw Fractography for Sintered Alpha Silicon Carbide
Author(s) -
Seshadri S. G.,
Srinivasan M.
Publication year - 1981
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1151-2916.1981.tb10284.x
Subject(s) - fractography , silicon carbide , materials science , fracture toughness , void (composites) , composite material , carbide , fracture (geology) , forensic engineering , engineering
An attempt to apply three‐dimensional flaw models to characterize fracture origins in sintered alpha silicon carbide is made. Some general improvements in the intrinsic flaw fractography results are obtained by using three‐dimensional void models instead of two‐dimensional crack models.