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X‐ray microbeam diffraction in a crystal
Author(s) -
Punegov Vasily I.,
Karpov Andrey V.
Publication year - 2021
Publication title -
acta crystallographica section a
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.742
H-Index - 83
ISSN - 2053-2733
DOI - 10.1107/s2053273320015715
Subject(s) - microbeam , diffraction , fresnel diffraction , optics , reciprocal lattice , physics , scattering , geometrical optics , x ray crystallography , crystal (programming language) , diffraction topography , crystal optics , fresnel number , laser , computer science , programming language
Using the formalism of dynamical scattering of spatially restricted X‐ray fields, the diffraction of a microbeam in a crystal with boundary functions for the incident and reflected amplitudes was studied in the case of geometrical optics and the Fresnel approximation (FA). It is shown that, for a wide front of the X‐ray field, the angular distributions of the scattered intensity in the geometrical optics approximation (GOA) and the FA are approximately the same. On the other hand, it is established that, for a narrow exit slit in the diffraction scheme, it is always necessary to take into account the X‐ray diffraction at the slit edges. Reciprocal‐space maps and the distribution of the diffraction intensity of the microbeam inside the crystal were calculated.