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speckle‐tracking : a software suite for ptychographic X‐ray speckle tracking
Author(s) -
Morgan Andrew J.,
Murray Kevin T.,
Quiney Harry M.,
Bajt Saša,
Chapman Henry N.
Publication year - 2020
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576720011991
Subject(s) - speckle pattern , python (programming language) , computer science , software , software suite , metrology , wavefront , optics , suite , computer vision , physics , archaeology , history , programming language , operating system
In recent years, X‐ray speckle‐tracking techniques have emerged as viable tools for wavefront metrology and sample imaging applications. These methods are based on the measurement of near‐field images. Thanks to their simple experimental setup, high angular sensitivity and compatibility with low‐coherence sources, these methods have been actively developed for use with synchrotron and laboratory light sources. Not only do speckle‐tracking techniques give the potential for high‐resolution imaging, but they also provide rapid and robust characterization of aberrations of X‐ray optical elements, focal spot profiles, and sample position and transmission properties. In order to realize these capabilities, software implementations are required that are equally rapid and robust. To address this need, a software suite has been developed for the ptychographic X‐ray speckle‐tracking technique, an X‐ray speckle‐based method suitable for highly divergent wavefields. The software suite is written in Python 3, with an OpenCL back end for GPU and multi‐CPU core processing. It is accessible as a Python module, through the command line or through a graphical user interface, and is available as source code under Version 3 or later of the GNU General Public License.