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Real‐time analysis for MBE by time‐resolved core‐level photoelectron spectroscopy
Author(s) -
Maeda Fumihiko,
Watanabe Yoshio,
Oshima Masaharu,
Taguchi Masami,
Oiwa Retsu
Publication year - 1998
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049597014799
Subject(s) - x ray photoelectron spectroscopy , synchrotron radiation , beamline , spectral line , synchrotron , photoemission spectroscopy , optics , detector , materials science , analytical chemistry (journal) , beam (structure) , chemistry , nuclear magnetic resonance , physics , chromatography , astronomy
A system has been developed for the real‐time analysis of surface reactions during molecular beam epitaxial growth which uses photoelectron spectroscopy with VUV light taken from synchrotron radiation. This system consists of a synchrotron radiation beamline and growth/analysis apparatus in which photoelectron spectroscopy is performed with sub‐second time resolution. In this system, photoelectron spectra are measured in sequence by a `non‐scanning' measurement method that enables the acquisition of snapshot photoelectron spectra using a multi‐channel detector. This non‐scanning measurement method was enabled by equipping an electric field correction grid. This system was used to monitor the photoelectron spectra of a GaSb(001) surface.

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