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A simple method for testing X‐ray beam uniformity
Author(s) -
Lenhert P. G.
Publication year - 1980
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889880011879
Subject(s) - simple (philosophy) , beam (structure) , materials science , optics , x ray , computer science , physics , epistemology , philosophy