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Small‐angle X‐ray diffraction studies and morphology of microporous materials and their 'hard' elastic precursors
Author(s) -
Noether H. D.,
Hay I. L.
Publication year - 1978
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889878013849
Subject(s) - microporous material , void (composites) , materials science , diffraction , crystallization , crystallography , small angle x ray scattering , x ray crystallography , morphology (biology) , composite material , chemical engineering , chemistry , optics , scattering , physics , geology , paleontology , engineering
Changes in small‐angle X‐ray diffraction when microporous materials, formed from hard elastic precursors, are immersed in liquids has established that the interlamellar fibrils are crystalline. It is concluded that the stabilization of the extended void structure is due to crystallization of the fibrils.