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Development of powder diffraction apparatus for small‐angle X‐ray scattering measurements
Author(s) -
Bóta Attila
Publication year - 2013
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188981205162x
Subject(s) - diffractometer , collimated light , scattering , materials science , diffraction , small angle scattering , small angle x ray scattering , powder diffraction , optics , x ray , x ray crystallography , range (aeronautics) , anomalous scattering , characterization (materials science) , powder diffractometer , crystallography , nanotechnology , physics , chemistry , composite material , scanning electron microscope , laser
A novel type of X‐ray collimation system attached to commercial powder diffractometers makes the structural characterization of nanomaterials possible in a wide size range from <0.1 to 100 nm by combination of the small‐ and wide‐angle X‐ray scattering techniques. There is no dead interval in the detection between the small‐ and wide‐angle regimes. This device can be attached to any existing `θ/θ' powder diffractometer, providing a multi‐functional small‐ and wide‐angle X‐ray scattering/diffraction (SWAXS) apparatus. After proper alignment and adjustment, the device can be removed and re‐attached at any time to switch between normal and SWAXS functions.