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Simulating and evaluating small‐angle X‐ray scattering of micro‐voids in polypropylene during mechanical deformation
Author(s) -
Fischer Stefan,
Diesner Tobias,
Rieger Bernhard,
Marti Othmar
Publication year - 2010
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889810006163
Subject(s) - scattering , polypropylene , deformation (meteorology) , materials science , small angle x ray scattering , small angle scattering , matlab , composite material , optics , mechanics , physics , computer science , operating system
Micro‐voids that evolve during mechanical deformation in polypropylene have been characterized by small‐angle X‐ray scattering. Such voids can be modelled as randomly distributed cylinders which are oriented along the stretching direction, showing a log‐normal size distribution. The model and simulation results are presented here. Advantages and disadvantages of the approach, the validity of the model, and important considerations for data evaluation are discussed. Data analysis of two‐dimensional scattering images has been performed using a fully automated MATLAB routine by direct model fitting to scattering images.