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Measuring the molten layer thickness of mold flux by electrode method
Author(s) -
Nan Yin,
Cai-liang Jing,
J. M. Zhang,
H. B. Li,
Yang Chen
Publication year - 2019
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/504/1/012104
Subject(s) - mold , electrode , materials science , flux (metallurgy) , layer (electronics) , casting , interference (communication) , process (computing) , continuous casting , conductivity , composite material , electrical resistivity and conductivity , mechanical engineering , metallurgy , computer science , channel (broadcasting) , electrical engineering , chemistry , engineering , operating system , computer network

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