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Image acquisition of the test-object by the CVL-10 copper vapor amplifier and optical bunch
Author(s) -
S. M. Arakelyan,
А. Ф. Галкин,
S. V. Zhirnova,
E. L. Shamanskaya
Publication year - 2019
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1331/1/012006
Subject(s) - optics , object (grammar) , projection (relational algebra) , microscope , lens (geology) , optical microscope , focus (optics) , laser , computer vision , artificial intelligence , physics , materials science , computer science , scanning electron microscope , algorithm
Images of the test object surface were obtained using a laser projection microscope and an optical bunch. Images of the surface of the test object at its different location in the experiment (the test object is located at the end of the optical bunch; the test object is located in a double focus lens; the test object is located after the optical bunch and optical system of two lenses) were obtained on the screen of a laser projection microscope.

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