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Method and industrial equipment for the X-ray diffraction control of the monocrystalline materials in machine and instrument engineering
Author(s) -
Н. Н. Потрахов,
В. А. Лифшиц,
E. N. Potrakhov,
D. K. Kostrin,
Н. А. Кузьмина
Publication year - 2018
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1121/1/012026
Subject(s) - monocrystalline silicon , diffraction , rod , materials science , orientation (vector space) , mechanical engineering , optics , metallurgy , engineering drawing , engineering , physics , silicon , mathematics , geometry , medicine , alternative medicine , pathology

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