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Transmission Electron Microscopy and Diffractometry of Materials, by Brent Fultz and James Howe. Published by Springer, 2001. Hardback, 748 pages, DM179, US$89.95, £61.50. ISBN 3‐540‐67841‐7.
Author(s) -
Hutchison John
Publication year - 2001
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.2001.00962-2.x
Subject(s) - citation , art history , library science , art , computer science