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Osaki, S./Nishio, T., Reliability Evaluation of Some Fault‐Tolerant Computer Architectures. Lecture Notes in Computer Science 97. Berlin‐Heidelberg‐New York, Springer‐Verlag 1980. VI, 129 S., 46 Abb., DM 18,–. US $ 10.70. ISBN 3‐540‐10274‐4
Author(s) -
Völz H.
Publication year - 1981
Publication title -
zamm ‐ journal of applied mathematics and mechanics / zeitschrift für angewandte mathematik und mechanik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.449
H-Index - 51
eISSN - 1521-4001
pISSN - 0044-2267
DOI - 10.1002/zamm.19810611217
Subject(s) - citation , computer science , library science , reliability (semiconductor) , operations research , physics , mathematics , thermodynamics , power (physics)

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